Addressing the effect of stacking faults in X-ray diffractograms of graphite through atom-scale simulations

Pascal Puech (1, 2) , Mathilde Jeanningros (2) , David Neumeyer (2) , Marc Monthioux (2)

1 CEMES-M3 - Matériaux Multi-fonctionnels et Multi-échelles
2 CEMES - Centre d'élaboration de matériaux et d'études structurales

Mots clés: X-ray diffraction; Graphite; Structure; Stacking faults; modeling

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Pascal Puech, Mathilde Jeanningros, David Neumeyer, Marc Monthioux. Addressing the effect of stacking faults in X-ray diffractograms of graphite through atom-scale simulations. Carbon Trends, 2023, 13, pp.100311. ⟨10.1016/j.cartre.2023.100311⟩. ⟨hal-04553433⟩