Dynamic SIMS for materials analysis in nuclear science

Paula Peres , Seo-Youn Choi , François Desse , Philippe Bienvenu (1) , Ingrid Roure (1) , Yves Pipon (2) , Clotilde Gaillard (2) , Nathalie Moncoffre (2) , Lola Sarrasin (2, 3) , Denis Mangin (4)

1 DEC - Département d'Etudes des Combustibles
2 IPNL - Institut de Physique Nucléaire de Lyon
3 IRSN/PSN-RES/SAM/LETR - Laboratoire d'étude de transfert des radioéléments
4 IJL - Institut Jean Lamour

Offering high sensitivity, depth profiling and ion imaging capabilities together with high throughput, dynamic secondary ion mass spectrometry (SIMS) proves extremely useful for a wide range of nuclear science applications. The CAMECA IMS 7f/7f-Auto is a versatile magnetic sector SIMS well suited for such applications. In this work, various examples of material analyses that are of interest for nuclear science are presented: depth profiling of the xenon and mapping of contaminants in CeO2, in-depth distribution of iodine in SiC using the energy filtering technique for improving the I detection limit, and depth profiling analysis of molybdenum in UO2 using eucentric sample rotation for minimizing surface roughness development (thus improving data quality).

Domaines: Instrumentations et Détecteurs [physics.ins-det]; Chimie analytique; Physique Nucléaire Expérimentale [nucl-ex]

Paula Peres, Seo-Youn Choi, François Desse, Philippe Bienvenu, Ingrid Roure, et al.. Dynamic SIMS for materials analysis in nuclear science. J.Vac.Sci.Tech.B, 2018, 36 (3), pp.03F117. ⟨10.1116/1.5017027⟩. ⟨hal-01959779⟩